High precision and contactless measurement
of the topology of spherical and aspherical optics
with the Luphos MWLI^®-Technology.

The Luphos Multiwavelength-Interferometry
is the new method for fast, flexible and nanometerprecise metrology of optical lenses, mirrors and precision components.

The Luphos-Sensor offers:

• contactless, fast measurement
• nanometer precision
• a large and flexible working distance for measurements on polished and rough surfaces
• high integrability
• multi probe measurement